We provide extensive material testing capabilities to ensure ASTM, AMS, and MIL-spec compliance as well as proprietary spec compliance when required. Our capabilities are:
Our SEM and EDS elemental analysis hardware is equipped with 3-16x optical magnification and SEM magnification up to 100,000x with a resolution of 10nm.
We are able to provide excellent B&W backscattered and secondary electron images of various materials, including non-conductive samples without additional preparation, utilizing our low, medium, and high vacuum capabilities. We can image large areas using our automated image mapping software. EDS elemental analysis can be performed using different settings such as point, line, and/or mapping.
We do so at a sample size of 100mm x 100mm and a sample height of 65mm max.
FTIR/ATR is used to obtain an infrared spectrum of absorption, emission, or reflection of a solid, liquid, or gas through a wide spectral range. Our Infrared range is from 4,000nm to 600nm. Mid-IR.
The infrared spectrum is the fingerprint of organic and inorganic materials.
FTIR/ATR is used for material characterization and verification of our incoming material.
Micro-size particle analysis and measurement of percent crystallinity of PEEK materials are possible when our FTIR is coupled with the microscope.
2571 E. Lindsay Privado, Ontario, CA 91761 USA
Phone (909) 930-6700 | Fax (909) 930-6702
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via U.Foscolo, 4 - 20060 Basiano, Milano, ITALY
Tel.: +39 0295760331 /Fax: +39 0295760333
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Borstelmannsweg 143
20537 Hamburg
GERMANY
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Suite 212, Building 2, N. 221
Yue Yang Road, Shanghai
CHINA
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1375 East Ninth Street, Suite 1800
Cleveland (OH) 44114
USA
+1 888-248-8206
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ZA L'Agavon
18 SynergiParc
13170 Les Pennes Mirabeau
FRANCE
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13522 Manhasset Rd
Apple Valley (CA) 92308
USA
Tel: +1 7602404999
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www.polymerconcepts.com
430 W Collins Avenue
Orange, CA 92867
USA
Ph. +1 714-937-1507
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2571 E. Lindsay Privado
Ontario, CA 9176
USA
Ph. +1 909-930-6700
Fx. +1 909-930-6702
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